Final answer:
The Atomic Force Microscope (AFM) utilizes a laser for cantilever bending measurement, a probe for topographical mapping, and is particularly effective with nonconducting samples for observations at the atomic level.
Step-by-step explanation:
An Atomic Force Microscope (AFM) is a high-resolution imaging technique that can be used to observe specimens at an atomic level. This tool has several areas of focus on a Zamboni-like surface scanning process:
The principle behind this technology involves detecting atomic-scale forces between the probe and the specimen, allowing for detailed surface characterization.