Final answer:
A smaller electron probe size in a SEM leads to higher resolution images with greater detail, but may also decrease signal strength and require more time for scanning.
Step-by-step explanation:
Reducing the electron probe size in a Scanning Electron Microscope (SEM) has a significant effect on the secondary electron image produced. A smaller probe size leads to a higher resolution image, as the electron beam can interact with a more localized area on the sample's surface. This increases the detail and sharpness of the image, allowing for greater surface topography and texture visualization. However, a smaller probe size may also reduce signal strength and could require a longer time to generate the image due to the finer scanning requirements.